i'm thinking he should also do another C-E measurement with the leads reversed from the first measurement and add that to the chart.
if i was fixing this item purely for functionality, i would try using silicon devices and changing the base bias. i would make it a reversible fix however just in case somebody were interested in buying it.
That's rather assuming the devices are faulty in the first place?, as I've said all along you should fault find, not randomly rip bits out and try and do passive tests on them (particularly on leaky germanium power devices).